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First Beam Characterization by Means of Emission Spectroscopy in the NIO1 Experiment
- Source :
- 17th International Conference on Ion Sources (ICIS 2017), pp. 080012-1–080012-3, Geneva (Switzerland), September 15-20, 2017, info:cnr-pdr/source/autori:Barbisan M.; Zaniol B.; Cavenago M.; Serianni G.; Pasqualotto R./congresso_nome:17th International Conference on Ion Sources (ICIS 2017)/congresso_luogo:Geneva (Switzerland)/congresso_data:September 15-20, 2017/anno:2018/pagina_da:080012-1/pagina_a:080012-3/intervallo_pagine:080012-1–080012-3
- Publication Year :
- 2022
-
Abstract
- The NIO1 experiment hosts a flexible RF H- ion source, developed by INFN-LNL and Consorzio RFX to improve the present concepts for the production and acceleration of negative ions. The source is also used to benchmark the instrumentation dedicated to the ITER neutral beam test facility. Many diagnostics are installed in NIO1 to characterize the source and the extracted negative ion beam. Among them, Beam Emission Spectroscopy (BES) has been used in NIO1 to measure the divergence and the uniformity of the beam, together with the fraction of beam ions which was neutralized inside the acceleration system. The diagnostic method is based on the analysis of the Doppler shifted $H_\alpha$ photons emitted by the fast beam particles and collected along a line of sight. The article presents the experimental setup and the analysis algorithms of the BES diagnostic, together with a discussion of the first measurements and of their correlation with the operational parameters.<br />Comment: 3 pages, 2 figures. Contributed paper for the ICIS 2017 conference. Accepted manuscript of a published paper
- Subjects :
- Accelerator Physics (physics.acc-ph)
Materials science
BES
business.industry
FOS: Physical sciences
BES Diagnostic
Physics - Plasma Physics
Characterization (materials science)
Plasma Physics (physics.plasm-ph)
NIO1
Optics
Negative Ion Optimization 1
Physics::Accelerator Physics
Physics - Accelerator Physics
Beam Emission Spectroscopy
Emission spectrum
business
Beam (structure)
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- 17th International Conference on Ion Sources (ICIS 2017), pp. 080012-1–080012-3, Geneva (Switzerland), September 15-20, 2017, info:cnr-pdr/source/autori:Barbisan M.; Zaniol B.; Cavenago M.; Serianni G.; Pasqualotto R./congresso_nome:17th International Conference on Ion Sources (ICIS 2017)/congresso_luogo:Geneva (Switzerland)/congresso_data:September 15-20, 2017/anno:2018/pagina_da:080012-1/pagina_a:080012-3/intervallo_pagine:080012-1–080012-3
- Accession number :
- edsair.doi.dedup.....3570a0e9990cb37ca5b6f5dc9ecf6d91