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Characterization of X- and gamma- ray CdTe radiation detectors

Authors :
E. Perillo
L. Campajola
D. Marano
M. Sowinska
G. Hennard
A. Raulo
Giovanni Paternoster
A., Raulo
M. S. O. W. I. N. S. K., A.
G., Hennard
Campajola, Luigi
D., Marano
Paternoster, Giovanni
Perillo, Eugenio
Publication Year :
2012

Abstract

CdTe crystals grown by the Traveling Heater Method (THM) often show a pronounced non-uniformity along the ingots due to the thermal irregularities, the Te-excess growth conditions resulting from the retrograde slope of the solidus line of the phase diagram, and to the introduced impurities. In addition, structural defects can be present that affect the electrical and optical properties of the crystals. © 2011 IEEE.

Subjects

Subjects :
Materials science
business.industry
Annealing (metallurgy)
Gamma ray
Crystal impurities, Defects, Detectors, Electric properties, Gamma rays, Ionizing radiation, Medical imaging, Metal castings, Nuclear physics, Optical properties, Phase diagrams, Radiation detectors, Semiconductor materials, X ray spectroscopy
Solidus
Particle detector
Cadmium telluride photovoltaics
Optics
Impurity
CdTe, CdTe crystals, Diffusion processes, Electrical and optical properties, Growth conditions, Nonuniformity, Particle beam measurements, Solidus lines, Structural defect, Traveling heater method
Optoelectronics
Cadmium telluride
business
Spectroscopy
Phase diagram

Details

Language :
English
Database :
OpenAIRE
Accession number :
edsair.doi.dedup.....380736f58449a8ef64cc5655189445c0

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