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Characterization of ta-C films prepared by a two-step filtered vacuum arc deposition technique
- Source :
- Scopus-Elsevier, ResearcherID
-
Abstract
- Adhesive strength is one of the most important properties of a coating, and one which could be improved by preparing an interface layer with increased ion energy, i.e. by applying high substrate-bias voltage. Hence, an investigation has been carried out to study the effect of substrate-bias voltage, and of the interface layer on the mechanical and tribological properties of ta-C films. In this presentation, the films are prepared by a two-step process. A relatively thick, hard layer of ta-C film is deposited on top of a relatively thin soft adhesive (interface) layer, which is deposited on a silicon substrate. The thin soft adhesive (interface) layer was prepared with a different ion energy, by controlling the high voltage negative substrate-bias. The thick hard layer on the top was prepared without any substrate-bias. The influence of substrate-bias during the preparation of the interface layer on the properties (structural, mechanical and tribological) of the ta-C films was investigated. The results show that the adhesive strength can be improved to a great extent, without much damage to the mechanical and tribological properties of the coating.
- Subjects :
- Materials science
Silicon
chemistry.chemical_element
Surfaces and Interfaces
General Chemistry
Vacuum arc
Substrate (electronics)
Tribology
engineering.material
Condensed Matter Physics
Surfaces, Coatings and Films
Coating
chemistry
Materials Chemistry
engineering
Adhesive
Composite material
Layer (electronics)
Deposition (law)
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- Scopus-Elsevier, ResearcherID
- Accession number :
- edsair.doi.dedup.....39b5289aa5e3f24c148d4afc9c8e85f1