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Deep p-Ring Trench Termination: An Innovative and Cost-Effective Way to Reduce Silicon Area
- Source :
- IEEE Electron Device Letters. 40:177-180
- Publication Year :
- 2019
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2019.
-
Abstract
- A new type of high-voltage termination, namely the “deep p-ring trench” termination design for high-voltage, high-power devices, is presented and extensively simulated. Termination of such devices consumes a large proportion of the chip size; the proposed design concept not only reduces the termination silicon area required but also removes the need for an additional mask as is the case of the traditional p+ ring-type termination. Furthermore, the presence of the p-ring under and around the bottom of the trench structure reduces the electric field peaks at the corners of the oxide, which results in reduced hot carrier injection and improved device reliability.
- Subjects :
- termination
010302 applied physics
Materials science
Silicon
business.industry
chemistry.chemical_element
High voltage
P ring
01 natural sciences
Electronic, Optical and Magnetic Materials
Power semiconductor devices
high voltage
Reliability (semiconductor)
chemistry
Hardware_GENERAL
Logic gate
0103 physical sciences
Trench
Hardware_INTEGRATEDCIRCUITS
Optoelectronics
Electric potential
Electrical and Electronic Engineering
business
Hot-carrier injection
Subjects
Details
- ISSN :
- 15580563 and 07413106
- Volume :
- 40
- Database :
- OpenAIRE
- Journal :
- IEEE Electron Device Letters
- Accession number :
- edsair.doi.dedup.....3a5e6485e1829c4ca31005862987a0aa