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Investigation of HV/HR-CMOS technology for the ATLAS Phase-II Strip Tracker Upgrade
- Source :
- Nuclear instruments & methods in physics research / A 831, 189-196 (2016). doi:10.1016/j.nima.2016.05.092
- Publication Year :
- 2016
-
Abstract
- Nuclear instruments & methods in physics research / A 831, 189 - 196(2016). doi:10.1016/j.nima.2016.05.092<br />ATLAS has formed strip CMOS project to study the use of CMOS MAPS devices as silicon strip sensors for the Phase-II Strip Tracker Upgrade. This choice of sensors promises several advantages over the conventional baseline design, such as better resolution, less material in the tracking volume, and faster construction speed. At the same time, many design features of the sensors are driven by the requirement of minimizing the impact on the rest of the detector. Hence the target devices feature long pixels which are grouped to form a virtual strip with binary-encoded z position. The key performance aspects are radiation hardness compatibility with HL-LHC environment, as well as extraction of the full hit position with full-reticle readout architecture. To date, several test chips have been submitted using two different CMOS technologies. The AMS 350 nm is a high voltage CMOS process (HV-CMOS), that features the sensor bias of up to 120 V. The TowerJazz 180 nm high resistivity CMOS process (HR-CMOS) uses a high resistivity epitaxial layer to provide the depletion region on top of the substrate. We have evaluated passive pixel performance, and charge collection projections. The results strongly support the radiation tolerance of these devices to radiation dose of the HL-LHC in the strip tracker region. We also describe design features for the next chip submission that are motivated by our technology evaluation.<br />Published by North-Holland Publ. Co., Amsterdam
- Subjects :
- Nuclear and High Energy Physics
01 natural sciences
damage [radiation]
upgrade [tracking detector]
technology [semiconductor detector]
semiconductor detector: pixel
0103 physical sciences
Electronic engineering
ddc:530
spatial resolution
Instrumentation
Image resolution
Radiation hardening
radiation: damage
pixel [semiconductor detector]
010302 applied physics
Physics
yield [charge]
semiconductor detector: technology
Pixel
010308 nuclear & particles physics
tracking detector: upgrade
charge: yield
Detector
microstrip [semiconductor detector]
ATLAS
Chip
Upgrade
CMOS
electronics: readout
semiconductor detector: microstrip
readout [electronics]
performance
Voltage
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- Nuclear instruments & methods in physics research / A 831, 189-196 (2016). doi:10.1016/j.nima.2016.05.092
- Accession number :
- edsair.doi.dedup.....3ba2315292d2b2f838b3bf0a0245adf9
- Full Text :
- https://doi.org/10.1016/j.nima.2016.05.092