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Low- vs. Middle-dose Total Skin Electron Beam Therapy for Mycosis Fungoides: An Efficiency-based Retrospective Survey of Skin Response

Authors :
Aurélie Du-Thanh
M. Charissoux
Christine Kerr
Annelies Taverniers
Olivier Dereure
Pathogénèse et contrôle des infections chroniques (PCCI)
Institut National de la Santé et de la Recherche Médicale (INSERM)-Centre Hospitalier Universitaire de Montpellier (CHU Montpellier )-Université de Montpellier (UM)
CRLCC Val d'Aurelle - Paul Lamarque
Centre Hospitalier Régional Universitaire [Montpellier] (CHRU Montpellier)
Source :
Acta Dermato-Venereologica, Vol 99, Iss 6, Pp 544-550 (2019), Acta Dermato-Venereologica, Acta Dermato-Venereologica, Society for Publication of Acta Dermato-Venereologica, 2019, 99 (6), pp.544-550. ⟨10.2340/00015555-3124⟩
Publication Year :
2019
Publisher :
Medical Journals Sweden AB, 2019.

Abstract

Optimal doses of total skin electron beam therapy for mycosis fungoides remain to be established. Clinical efficiency and adverse effects of middle-dose (25 Gy) vs. low-dose (10-12 Gy) total skin electron beam therapy were retrospectively compared in a series of 14 and 12 mycosis fungoides, respectively. Overall skin response rate was 96.2% (92.9% middle-dose and 100% low-dose; not significant (NS)). Overall complete and partial skin response rates were 57.7% (42.9% middle-dose and 75% low-dose; NS) and 38.5% (50% middle-dose and 25% low-dose; NS), respectively. All responding patients relapsed after an overall median time of 5 months (7 months middle-dose vs. 4 months low-dose; p = 0.164, NS). Tolerance was equally fair in both groups, with only grade 1 and 2 adverse events observed in 100% vs. 66.7% of patients in middle-dose and low-dose groups (NS). Although no significant difference was observed, middle-dose protocol may be recommended owing to a longer relapse-free survival for a similar tolerance.

Details

ISSN :
00015555
Volume :
99
Database :
OpenAIRE
Journal :
Acta Dermato Venereologica
Accession number :
edsair.doi.dedup.....3baaba117505270299d4e088a4abb951
Full Text :
https://doi.org/10.2340/00015555-3124