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Parts-per-Million-Level Doping Effects in Organic Semiconductor Films and Organic Single Crystals
- Source :
- Advanced Materials. 31:1801236
- Publication Year :
- 2018
- Publisher :
- Wiley, 2018.
-
Abstract
- Controlling the pn-type behavior of a semiconductor such as silicon by adding an extremely small quantity of an impurity (doping) is a central part of inorganic semiconductor electronics since the 20th century. Recent progress in the doping of organic semiconductors strongly suggests the advent of a new era of doped organic semiconductors. Here, the principles and effects of doping at the level of parts per million (ppm) in organic semiconductor films and single crystals are described, including descriptions of complete pn-control, doping sensitization, ppm doping using an extremely low-speed deposition technique reaching 10-9 nm s-1 , and emerging ppm-level doping effects, such as trap filling, majority carriers, homojunction formation, and decreased mobility, as well as ppm-level doping effects in organic single crystals measured by the Hall effect, which shows a doping efficiency of 24%. The Wannier excitonic doping of organic single crystals possessing band conduction and the defect science of organic single crystals related to carrier trapping and scattering are introduced as a new scientific field. The dawn of organic single-crystal electronics is also discussed.
- Subjects :
- Materials science
Silicon
chemistry.chemical_element
02 engineering and technology
010402 general chemistry
01 natural sciences
Condensed Matter::Materials Science
Impurity
Hall effect
Condensed Matter::Superconductivity
General Materials Science
Homojunction
business.industry
Scattering
Mechanical Engineering
Doping
Condensed Matter::Mesoscopic Systems and Quantum Hall Effect
021001 nanoscience & nanotechnology
0104 chemical sciences
Organic semiconductor
Semiconductor
chemistry
Mechanics of Materials
Optoelectronics
Condensed Matter::Strongly Correlated Electrons
0210 nano-technology
business
Subjects
Details
- ISSN :
- 09359648
- Volume :
- 31
- Database :
- OpenAIRE
- Journal :
- Advanced Materials
- Accession number :
- edsair.doi.dedup.....3dda83fb6641ac243235f94472144c2c
- Full Text :
- https://doi.org/10.1002/adma.201801236