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Dependent microstructure noise and integrated volatility estimation from high-frequency data

Authors :
Michel Vellekoop
Z. Merrick Li
Roger J. A. Laeven
Faculteit Economie en Bedrijfskunde
Actuarial Science & Mathematical Finance (ASE, FEB)
Source :
Journal of Econometrics, 215(2), 536-558. Elsevier
Publication Year :
2020

Abstract

In this paper, we develop econometric tools to analyze the integrated volatility of the efficient price and the dynamic properties of microstructure noise in high-frequency data under general dependent noise. We first develop consistent estimators of the variance and autocovariances of noise using a variant of realized volatility. Next, we employ these estimators to adapt the pre-averaging method and derive a consistent estimator of the integrated volatility, which converges stably to a mixed Gaussian distribution at the optimal rate $n^{1/4}$. To refine the finite sample performance, we propose a two-step approach that corrects the finite sample bias, which turns out to be crucial in applications. Our extensive simulation studies demonstrate the excellent performance of our two-step estimators. In an empirical study, we characterize the dependence structures of microstructure noise in several popular sampling schemes and provide intuitive economic interpretations; we also illustrate the importance of accounting for both the serial dependence in noise and the finite sample bias when estimating integrated volatility.

Details

Language :
English
ISSN :
03044076
Volume :
215
Issue :
2
Database :
OpenAIRE
Journal :
Journal of Econometrics
Accession number :
edsair.doi.dedup.....40219d5c5bd9a60b4d5cfbf4028607fe