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High resolution residual stress measurement on amorphous and crystalline plasma-sprayed single-splats

Authors :
Edoardo Bemporad
Luca Lusvarghi
Partha Pratim Bandyopadhyay
Giovanni Bolelli
Marco Sebastiani
Sebastiani, Marco
Bolelli, G
Lusvarghi, L
Bandyopadhyay, Pp
Bemporad, Edoardo
Source :
Surface and Coatings Technology. 206:4872-4880
Publication Year :
2012
Publisher :
Elsevier BV, 2012.

Abstract

Residual stress was measured on plasma sprayed crystalline Ni Al, Al2O3 and amorphous Al2O3 TiO2 ZrO2 CeO2 single splats, by using an incremental focused ion beam (FIB) micron-scale ring-core method (IμRCM). Tensile residual stress exists in polycrystalline Ni Al splats, where the quenching stress is only partially relaxed by edge curling and through-thickness yielding. Significant compressive stress was observed for the amorphous Al2O3 TiO2 ZrO2 CeO2 splats, where viscous flow above the glass transition temperature completely relaxed the quenching stresses without micro-cracking. Comparatively lower compressive stress was measured on crystalline Al2O3 splats, where, in spite of extensive micro-cracking, not all of the tensile quenching stress was relaxed. Using stress data and micro-crack geometry, the intrinsic shear adhesion strength of Al2O3 splats was calculated, giving insights into the role of (sub)micron-scale phenomena on adhesion/cohesion of thermally sprayed coatings. The proposed stress build-up mechanisms and relaxation phenomena are supported by a TEM microstructural analysis of the splats. The experimental methodology developed provided a unique way for the study of the residual stress build-up mechanisms in amorphous and crystalline single splats obtained by plasma spraying, and gave further insights into the actual micro-scale phenomena that give rise to adhesion and nano-mechanical behavior of thermally sprayed coatings. The proposed approach is also expected to find a wide range of applications in materials science and engineering, as it allows for the residual stress measurement even on amorphous materials with micrometer spatial resolution.

Details

ISSN :
02578972
Volume :
206
Database :
OpenAIRE
Journal :
Surface and Coatings Technology
Accession number :
edsair.doi.dedup.....413dddfa2aa61f49d3b5c6cfc5fc05a5