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Improving OFF-State Bias-Stress Stability in High-Mobility Conjugated Polymer Transistors with an Antisolvent Treatment

Authors :
Nguyen, Malgorzata
Kraft, Ulrike
Tan, Wen Liang
Dobryden, Illia
Broch, Katharina
Zhang, Weimin
Un, Hio-Ieng
Simatos, Dimitrios
Venkateshavaran, Deepak
McCulloch, Iain
Claesson, Per M
McNeill, Christopher R
Sirringhaus, Henning
Sirringhaus, Henning [0000-0001-9827-6061]
Apollo - University of Cambridge Repository
Publication Year :
2023
Publisher :
Wiley, 2023.

Abstract

Conjugated polymer field-effect transistors are emerging as an enabling technology for flexible electronics due to their excellent mechanical properties combined with sufficiently high charge carrier mobilities and compatibility with large-area, low-temperature processing. However, their electrical stability remains a concern. ON-state (accumulation mode) bias-stress instabilities in organic semiconductors have been widely studied, and multiple mitigation strategies have been suggested. In contrast, OFF-state (depletion mode) bias-stress instabilities remain poorly understood despite being crucial for many applications in which the transistors are held in their OFF-state for most of the time. Here, we present a simple method of using an anti-solvent treatment to achieve significant improvements in OFF-state bias-stress and environmental stability as well as general device performance for one of the best performing polymers, solution-processable indacenodithiophene-co-benzothiadiazole (IDT-BT). IDT-BT is weakly crystalline, and we attribute the notable improvements to an anti-solvent-induced, increased degree of crystallinity, resulting in a lower probability of electron trapping and the removal of charge traps. Our work highlights the importance of the microstructure in weakly crystalline polymer films and offers a simple processing strategy for achieving the reliability required for applications in flexible electronics. This article is protected by copyright. All rights reserved.

Details

Database :
OpenAIRE
Accession number :
edsair.doi.dedup.....430b39eb47966692da5e0e0fa81ce086