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A BJT-Based Temperature-to-Digital Converter With a ±0.25 °C 3$\sigma$ -Inaccuracy From −40 °C to +180 °C Using Heater-Assisted Voltage Calibration

Authors :
Kofi A. A. Makinwa
Bahman Yousefzadeh
Source :
IEEE Journal of Solid State Circuits, 55(2)
Publication Year :
2020
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2020.

Abstract

This article presents a BJT-based temperature-to-digital-converter (TDC) that achieves ±0.25 °C 3 sigma -inaccuracy from -40 °C to +180 °C after a heater-assisted voltage calibration (HA-VCAL). Its switched-capacitor (SC) ADC employs two sampling capacitors and, thus, the minimum number of critical sampling switches, which minimizes the effects of switch leakage at high temperatures and improves accuracy. The TDC is also equipped with an on-chip heater, with which the sensing BJTs can be rapidly (2 and operates from 1.8 V.

Details

ISSN :
1558173X and 00189200
Volume :
55
Database :
OpenAIRE
Journal :
IEEE Journal of Solid-State Circuits
Accession number :
edsair.doi.dedup.....442d3f873ae6560cd67c4fa85d1c8bfb
Full Text :
https://doi.org/10.1109/jssc.2019.2953834