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Design Migration From Peripheral ASIC Design to Area-I/O Flip-Chip Design by Chip I/O Planning and Legalization
- Source :
- IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 16:108-112
- Publication Year :
- 2008
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2008.
-
Abstract
- Due to higher input/output (I/O) count and power delivery problem in deep submicrometer (DSM) regime, flip-chip technology, especially for area-array architecture, has provided more opportunities for adoption than traditional peripheral bonding design style in high-performance application-specific integrated circuit and microprocessor designs. However, it is hard to tell which technique can provide better design cost edge in usually concerned perspectives. In this paper, we present a methodology to convert a previous peripheral bonding design to an area-I/O flip-chip design. It is based on an I/O buffer modeling and an I/O planning algorithm to legalize I/O buffer blocks with core placement without sacrificing much of the previous optimization in the original core placement. The experimental results have shown that we have achieved better area and I/O wirelength in area-IO flip-chip configuration (especially for pad-limit designs), compared with peripheral bonding configuration in packaging consideration.
- Subjects :
- Engineering
business.industry
Circuit design
Integrated circuit design
Integrated circuit
Chip
Integrated circuit layout
Power (physics)
law.invention
Microprocessor
Application-specific integrated circuit
Flip chip design
Hardware and Architecture
law
Embedded system
Hardware_INTEGRATEDCIRCUITS
Enhanced Data Rates for GSM Evolution
Integrated circuit packaging
Electrical and Electronic Engineering
business
Computer hardware
Software
Flip chip
Subjects
Details
- ISSN :
- 10638210
- Volume :
- 16
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Very Large Scale Integration (VLSI) Systems
- Accession number :
- edsair.doi.dedup.....4826bbf00211b022e1550ddd27c2a266
- Full Text :
- https://doi.org/10.1109/tvlsi.2007.912202