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HRTEM study of structural defects and related deformation mechanisms induced by nanocompression of silicon
- Source :
- European Microscopy Congress, European Microscopy Congress, Aug 2016, Lyon, France, HAL
- Publication Year :
- 2016
- Publisher :
- HAL CCSD, 2016.
-
Abstract
- International audience
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- European Microscopy Congress, European Microscopy Congress, Aug 2016, Lyon, France, HAL
- Accession number :
- edsair.doi.dedup.....4a1a2d12918706aa620f4fa9451b9920