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Laser Reactive Ablation Deposition of Silicon Carbide Films

Authors :
Armando Luches
Paolo Mengucci
Rodica Alexandrescu
Eniko Gyorgy
Guiseppe Majni
Maurizio Martino
Gilberto Leggieri
Ion N. Mihailescu
Andrei Barborica
Alessio Perrone
G., Leggieri
A., Luche
Martino, Maurizio
Perrone, Alessio
R., Alexandrescu
A., Barborica
E., Gyorgy
I. N., Mihailescu
G., Majni
P., Mengucci
Leggieri, Gilberto
Luches, Armando
M., Martino
Publication Year :
1996

Abstract

Silicon carbide films were deposited on Si wafers (at room temperature and 150°C) by XeCl laser (fluence 5 J/cm2, pulse duration 30 ns, repetition rate 10 Hz) ablation of Si in low pressure (0.25–6 mbar) CH4 atmosphere. The deposits were characterized by different diagnostic techniques (XRD, XPS, RBS, etc.). Polycrystalline stoichiometric silicon carbide films ∼ 1 μm thick were obtained under specific conditions after ∼ 104 laser pulses.

Details

Language :
English
Database :
OpenAIRE
Accession number :
edsair.doi.dedup.....51b26655c119528257f45ea92134b189