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Influence of low temperature annealing on Nickel RTDs designed for heat flux sensing

Authors :
Sylvie Bégot
Youssef Mokadem
Aymen Zribi
Magali Barthès
François Lanzetta
Jean-Yves Rauch
Virginie Moutarlier
Franche-Comté Électronique Mécanique, Thermique et Optique - Sciences et Technologies (UMR 6174) (FEMTO-ST)
Université de Technologie de Belfort-Montbeliard (UTBM)-Ecole Nationale Supérieure de Mécanique et des Microtechniques (ENSMM)-Université de Franche-Comté (UFC)
Université Bourgogne Franche-Comté [COMUE] (UBFC)-Université Bourgogne Franche-Comté [COMUE] (UBFC)-Centre National de la Recherche Scientifique (CNRS)
Univers, Transport, Interfaces, Nanostructures, Atmosphère et environnement, Molécules (UMR 6213) (UTINAM)
Université de Franche-Comté (UFC)
Université Bourgogne Franche-Comté [COMUE] (UBFC)-Université Bourgogne Franche-Comté [COMUE] (UBFC)-Centre National de la Recherche Scientifique (CNRS)-Institut national des sciences de l'Univers (INSU - CNRS)
Source :
International Metrology Congress, International Metrology Congress, Sep 2019, Paris, France
Publication Year :
2019
Publisher :
HAL CCSD, 2019.

Abstract

International audience; In this paper, we study the influence of annealing on the performance of Resistive Temperature Detectors made from Nickel thin films. The aimed application is heat flux sensing. The substrate is made of Borofloat glass with a Chromium adhesive layer. Several annealing temperatures between 150°C and 300°C are applied to this assembly. The thin films as deposited and after annealing are analyzed through SEM images. The evolution of the resistance and the temperature coefficient of the sensor are discussed. An annealing temperature is selected that ensures the repeatability of measurements.

Details

Language :
English
Database :
OpenAIRE
Journal :
International Metrology Congress, International Metrology Congress, Sep 2019, Paris, France
Accession number :
edsair.doi.dedup.....52c422d0180885d2442085acfbe9131c