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Effects of p doping on GaAs/AlGaAs SAM-APDs for X-rays detection
- Source :
- Journal of instrumentation 15 (2020). doi:10.1088/1748-0221/15/02/C02013, info:cnr-pdr/source/autori:Nichetti, C.; Steinhartova, T.; Antonelli, M.; Biasiol, G.; Cautero, G.; De Angelis, D.; Pilotto, A.; Driussi, F.; Palestri, P.; Selmi, L.; Arfelli, F.; Danailov, M.; Menk, R. H./titolo:Effects of p doping on GaAs%2FAlGaAs SAM-APDs for X-rays detection/doi:10.1088%2F1748-0221%2F15%2F02%2FC02013/rivista:Journal of instrumentation/anno:2020/pagina_da:/pagina_a:/intervallo_pagine:/volume:15
- Publication Year :
- 2020
- Publisher :
- Institute of Physics Publishing, Bristol , Regno Unito, 2020.
-
Abstract
- This work focuses on avalanche photodiodes based on GaAs/AlGaAs with separated absorption and multiplication regions (SAM-APDs). The two regions are separated by a thin p-doped layer which, under the application of a reverse bias, is able to confine the potential drop only in the multiplication region. We realized such layer under the form of either a delta sheet of C atoms or a 50-nm-thick GaAs:C layer. Devices with these two structures will be discussed and compared in terms of capacitance and response to light.
- Subjects :
- Materials science
APDS
Charge transport and multiplication in solid media
Detector design and construction technologies and materials
Solid state detectors
Voltage distributions
01 natural sciences
Capacitance
030218 nuclear medicine & medical imaging
law.invention
03 medical and health sciences
0302 clinical medicine
law
0103 physical sciences
Absorption (electromagnetic radiation)
Instrumentation
Mathematical Physics
Detector design and construction technologies and material
010308 nuclear & particles physics
business.industry
Doping
Avalanche photodiode
Optoelectronics
Multiplication
Solid state detector
business
Layer (electronics)
Voltage drop
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- Journal of instrumentation 15 (2020). doi:10.1088/1748-0221/15/02/C02013, info:cnr-pdr/source/autori:Nichetti, C.; Steinhartova, T.; Antonelli, M.; Biasiol, G.; Cautero, G.; De Angelis, D.; Pilotto, A.; Driussi, F.; Palestri, P.; Selmi, L.; Arfelli, F.; Danailov, M.; Menk, R. H./titolo:Effects of p doping on GaAs%2FAlGaAs SAM-APDs for X-rays detection/doi:10.1088%2F1748-0221%2F15%2F02%2FC02013/rivista:Journal of instrumentation/anno:2020/pagina_da:/pagina_a:/intervallo_pagine:/volume:15
- Accession number :
- edsair.doi.dedup.....532643016e915d8f8b7fcfb4eb52b1f7
- Full Text :
- https://doi.org/10.1088/1748-0221/15/02/C02013