Back to Search
Start Over
Correlation between the reliability of HEMT devices and that of a combined oscillator-amplifier
- Source :
- Schreurs, D. ; De Raedt, W. ; Vandersmissen, R. ; Neuhaus, B. ; Beyer, A. ; Nauwelaers, B. (2001) Correlation between the reliability of HEMT devices and that of a combined oscillator-amplifier. In: Gallium Arsenide applications symposium. Gaas 2001, 24-28 September 2001, London.
- Publication Year :
- 2001
- Publisher :
- Microwave engineering Europe, 2001.
-
Abstract
- We evaluate an oscillator-amplifier MMIC submitted to high-temperature operating life time tests. To relate adequately these results with individual components’ results, it is important to realise that failure mechanisms in non-linear MMICs are governed by the maximally instantaneous voltages/currents and hence that comparisons should be conducted at equal instantaneous conditions.
- Subjects :
- ING-INF/01 Elettronica
Subjects
Details
- Language :
- Italian
- Database :
- OpenAIRE
- Journal :
- Schreurs, D. ; De Raedt, W. ; Vandersmissen, R. ; Neuhaus, B. ; Beyer, A. ; Nauwelaers, B. (2001) Correlation between the reliability of HEMT devices and that of a combined oscillator-amplifier. In: Gallium Arsenide applications symposium. Gaas 2001, 24-28 September 2001, London.
- Accession number :
- edsair.doi.dedup.....55809629a29e16218c92de6a55856663