Correlation between the reliability of HEMT devices and that of a combined oscillator-amplifier

Authors :: Schreurs, D.
De Raedt, W.
Vandersmissen, R.
Neuhaus, B.
Beyer, A.
Nauwelaers, B.
Source :: Schreurs, D. ; De Raedt, W. ; Vandersmissen, R. ; Neuhaus, B. ; Beyer, A. ; Nauwelaers, B. (2001) Correlation between the reliability of HEMT devices and that of a combined oscillator-amplifier. In: Gallium Arsenide applications symposium. Gaas 2001, 24-28 September 2001, London.
Publication Year :: 2001
Publisher :: Microwave engineering Europe, 2001.
Abstract: We evaluate an oscillator-amplifier MMIC submitted to high-temperature operating life time tests. To relate adequately these results with individual components’ results, it is important to realise that failure mechanisms in non-linear MMICs are governed by the maximally instantaneous voltages/currents and hence that comparisons should be conducted at equal instantaneous conditions.

Language :: Italian
Database :: OpenAIRE
Journal :: Schreurs, D. ; De Raedt, W. ; Vandersmissen, R. ; Neuhaus, B. ; Beyer, A. ; Nauwelaers, B. (2001) Correlation between the reliability of HEMT devices and that of a combined oscillator-amplifier. In: Gallium Arsenide applications symposium. Gaas 2001, 24-28 September 2001, London.
Accession number :: edsair.doi.dedup.....55809629a29e16218c92de6a55856663

Tools