Back to Search
Start Over
Simulation studies on electrical characteristics of silicon nanowire feedback field-effect transistors with interface trap charges
- Source :
- Scientific Reports, Vol 11, Iss 1, Pp 1-8 (2021), Scientific Reports
- Publication Year :
- 2021
- Publisher :
- Springer Science and Business Media LLC, 2021.
-
Abstract
- In this study, we examine the electrical characteristics of silicon nanowire feedback field-effect transistors (FBFETs) with interface trap charges between the channel and gate oxide. The band diagram, I–V characteristics, memory window, and operation were analyzed using a commercial technology computer-aided design simulation. In an n-channel FBFET, the memory window narrows (widens) from 5.47 to 3.59 V (9.24 V), as the density of the positive (negative) trap charges increases. In contrast, in the p-channel FBFET, the memory window widens (narrows) from 5.38 to 7.38 V (4.18 V), as the density of the positive (negative) trap charges increases. Moreover, we investigate the difference in the output drain current based on the interface trap charges during the memory operation.
- Subjects :
- Materials science
Science
Interface (computing)
Oxide
Article
law.invention
Trap (computing)
chemistry.chemical_compound
Nanoscience and technology
law
Band diagram
Electronic devices
Silicon nanowires
Multidisciplinary
business.industry
Physics
Transistor
Nanoscale devices
chemistry
Medicine
Optoelectronics
Field-effect transistor
business
AND gate
Subjects
Details
- ISSN :
- 20452322
- Volume :
- 11
- Database :
- OpenAIRE
- Journal :
- Scientific Reports
- Accession number :
- edsair.doi.dedup.....5784b6eccc511f97d33899e29e06ea62