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Three-dimensional characterization of OTFT on modified hydrophobic flexible polymeric substrate by low energy Cs + ion sputtering
- Source :
- Applied surface science 448 (2018): 628–635. doi:10.1016/j.apsusc.2018.04.097, info:cnr-pdr/source/autori:Tortora L.; Urbini M.; Fabbri A.; Branchini P.; Mariucci L.; Rapisarda M.; Barra M.; Chiarella F.; Cassinese A.; Di Capua F.; Aloisio A./titolo:Three-dimensional characterization of OTFT on modified hydrophobic flexible polymeric substrate by low energy Cs+ion sputtering/doi:10.1016%2Fj.apsusc.2018.04.097/rivista:Applied surface science/anno:2018/pagina_da:628/pagina_a:635/intervallo_pagine:628–635/volume:448
- Publication Year :
- 2018
-
Abstract
- Here, electron-transporting semiconducting organic channels made of N,N′-1H, 1H-perfluorobutyl dicyanoperylenecarboxydiimmide (PDIF-CN2) molecules were thermally evaporated on flexible polyethylene-naphtalate (PEN) plastic substrates equipped with gold (Au) electrodes. This multilayer structure represents the basic component for the fabrication of staggered top-gate n-type organic thin-film transistors (OTFTs) to be completed with the addition of a polymeric dielectric layer and an aluminum gate electrode. PEN substrate was treated with hexamethyldisilazane (HMDS) in order to make it more hydrophobic. Indeed, the hydrophobized surface of the plastic substrate was shown to induce a more ordered supramolecular structure of the semiconductor layer during the evaporation process. The hybrid organic/inorganic formally trilayer non-passivated OTFT structure was successfully profiled in a single run through ToF-SIMS depth profiling experiments with low energy cesium ions. High mass molecular fragment ions were obtained and used as indicators of interfaces, leading to an increase of information on molecular specificity. The HMDS surface modification was clearly detected and spatially located. Finally, a chemometric approach was also adopted to evaluate depth profiling data. In particular, principal component analysis (PCA) and K-means algorithm were tested as innovative method for the identification of molecular fragments useful for the OTFT multi-layer structure characterization and the determination of the number of OTFT layers, respectively.
- Subjects :
- Fabrication
Materials science
Supramolecular chemistry
General Physics and Astronomy
02 engineering and technology
Organic electronic
OTFT
010402 general chemistry
01 natural sciences
Ion
Molecule
Organic electronics
PCA
business.industry
Surfaces and Interfaces
General Chemistry
021001 nanoscience & nanotechnology
Condensed Matter Physics
0104 chemical sciences
Surfaces, Coatings and Films
Semiconductor
Chemical engineering
Depth profiling
Electrode
Surface modification
0210 nano-technology
business
ToF-SIMS
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- Applied surface science 448 (2018): 628–635. doi:10.1016/j.apsusc.2018.04.097, info:cnr-pdr/source/autori:Tortora L.; Urbini M.; Fabbri A.; Branchini P.; Mariucci L.; Rapisarda M.; Barra M.; Chiarella F.; Cassinese A.; Di Capua F.; Aloisio A./titolo:Three-dimensional characterization of OTFT on modified hydrophobic flexible polymeric substrate by low energy Cs+ion sputtering/doi:10.1016%2Fj.apsusc.2018.04.097/rivista:Applied surface science/anno:2018/pagina_da:628/pagina_a:635/intervallo_pagine:628–635/volume:448
- Accession number :
- edsair.doi.dedup.....59806d54a04fc3c96af886b64dcc0d86