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Impulsive noise reduction for transient Earth voltage‐based partial discharge using Wavelet‐entropy
- Source :
- IET Science, Measurement & Technology. 10:69-76
- Publication Year :
- 2016
- Publisher :
- Institution of Engineering and Technology (IET), 2016.
-
Abstract
- Partial discharge (PD) is caused by the localized electrical field intensification in insulating materials. Early detection and accurate measurement of PD are very important for preventing premature failure of the insulating material. Detection of PDs in metal-clad apparatus through the Transient Earth Voltage (TEV) method is a promising approach in non-intrusive on-line tests. However, the electrical interference from background environment remains the major barrier to improving its measurement accuracy. In this paper, a wavelet-entropy-based PD de-noising method has been proposed. The unique features of PD are characterized by combining wavelet analysis that reveals the local features and entropy that measures the disorder. With such features, a feed-forward back-propagation Artificial Neural Network (ANN) is adopted to recognize the actual PDs from noisy background. Comparing with other methods such as the energy-based method and the similarity-comparing method, the proposed wavelet-entropy-based method is more effective in PD signal de-noising. NRF (Natl Research Foundation, S’pore) Published version
- Subjects :
- 010302 applied physics
Materials science
020209 energy
Acoustics
Noise reduction
Wavelet transform
02 engineering and technology
Impulse noise
01 natural sciences
Atomic and Molecular Physics, and Optics
Electromagnetic interference
Signal denoising
Wavelet
0103 physical sciences
Partial discharge
0202 electrical engineering, electronic engineering, information engineering
Electronic engineering
Entropy (information theory)
Electrical and Electronic Engineering
Voltage
Subjects
Details
- ISSN :
- 17518830
- Volume :
- 10
- Database :
- OpenAIRE
- Journal :
- IET Science, Measurement & Technology
- Accession number :
- edsair.doi.dedup.....641c7a68e96072e14501a56000950514
- Full Text :
- https://doi.org/10.1049/iet-smt.2014.0203