Cite
Latent reliability degradation of ultra-thin oxides after heavy ion and γ-ray irradiation
MLA
C.E. Weintraub, et al. “Latent Reliability Degradation of Ultra-Thin Oxides after Heavy Ion and γ-Ray Irradiation.” 2001 IEEE International Integrated Reliability Workshop. Final Report (Cat. No.01TH8580), July 2003. EBSCOhost, https://doi.org/10.1109/irws.2001.993910.
APA
C.E. Weintraub, Bin Wang, Eric M. Vogel, J.R. Conley, Joseph Bernstein, John S. Suehle, & A.H. Johnston. (2003). Latent reliability degradation of ultra-thin oxides after heavy ion and γ-ray irradiation. 2001 IEEE International Integrated Reliability Workshop. Final Report (Cat. No.01TH8580). https://doi.org/10.1109/irws.2001.993910
Chicago
C.E. Weintraub, Bin Wang, Eric M. Vogel, J.R. Conley, Joseph Bernstein, John S. Suehle, and A.H. Johnston. 2003. “Latent Reliability Degradation of Ultra-Thin Oxides after Heavy Ion and γ-Ray Irradiation.” 2001 IEEE International Integrated Reliability Workshop. Final Report (Cat. No.01TH8580), July. doi:10.1109/irws.2001.993910.