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Effect of Aromatic SAMs Molecules on Graphene/Silicon Schottky Diode Performance

Authors :
Nesli Yagmurcukardes
Hasan Aydın
Mustafa Can
Yusuf Selamet
Salih Okur
Alper Yanılmaz
Omer Mermer
Yağmurcukardeş, Nesli
Aydın, Hasan
Yanılmaz, Alper
Selamet, Yusuf
Izmir Institute of Technology. Materials Science and Engineering
Izmir Institute of Technology. Physics
Ege Üniversitesi
Source :
ECS Journal of Solid State Science and Technology. 5:M69-M73
Publication Year :
2016
Publisher :
The Electrochemical Society, 2016.

Abstract

WOS: 000378840000029<br />Au/n-Si/Graphene/Au Schottky diodes were fabricated by transferring atmospheric pressure chemical vapor deposited (APCVD) graphene on silicon substrates. Graphene/n-Si interface properties were improved by using 5-[(3-methylphenyl)(phenyl) amino] isophthalic acid (MePIFA) and 5-(diphenyl) amino] isophthalic acid (DPIFA) aromatic self-assembled monolayer (SAM) molecules. The surface morphologies of modified and non-modified films were investigated by atomic force microscopy and scanning electron microscopy. The surface potential characteristics were obtained by Kelvin-probe force microscopy and found as 0.158 V, 0.188 V and 0,383 V as a result of SAMs modification. The ideality factors of n-Si/Graphene, n-Si/MePIFA/Graphene and n-Si/DPIFA/Graphene diodes were found as 1.07, 1.13 and 1.15, respectively. Due to the chain length of aromatic organic MePIFA and DPIFA molecules, also the barrier height phi(B) values of the devices were decreased. While the barrier height of n-Si/Graphene diode was obtained as 0.931 eV, n-Si/MePIFA/Graphene and n-Si/DPIFA/Graphene diodes have barrier height of 0.820 and 0.720 eV, respectively. (C) 2016 The Electrochemical Society. All rights reserved.<br />TUBITAK (The Scientific and Technical Research Council of Turkey)Turkiye Bilimsel ve Teknolojik Arastirma Kurumu (TUBITAK) [112T946]<br />This work was supported by TUBITAK (The Scientific and Technical Research Council of Turkey) with project number 112T946. We also thank AQuReC (Applied Quantum Research Center) for Raman measurements.

Details

ISSN :
21628777 and 21628769
Volume :
5
Database :
OpenAIRE
Journal :
ECS Journal of Solid State Science and Technology
Accession number :
edsair.doi.dedup.....67b825110e07528c9bc639e4224b0987