Cu/polyphenylacetylene interface investigated by means of XPS

XPS investigation of the early stages of Cu/PPA interface formation has been performed in the range of coverage 0.5 A 13 A Cu . Copper is found to grow in a layer-by-layer mode without interdiffusion with the substrate. Weak chemical interaction between Cu and the π ring electrons of the phenyl groups is evidenced by monitoring the changes occuring at the C 1s secondary structure π→π ∗ shake up transition.