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Virtual test reduces semiconductor product development time

Authors :
D. Heffernan
T. Hogan
Source :
Engineering Science & Education Journal. 10:106-112
Publication Year :
2001
Publisher :
Institution of Engineering and Technology (IET), 2001.

Abstract

In the semiconductor industry's evolutionary life cycle, the speed at which products are introduced to the market-space is key to the competitive success of individual companies. The semiconductor industry is classed as a fast-changing industry in which product technology, manufacturing process technology and industry organisation need to be continuously updated in relatively short cycle times. This paper looks at the test engineering aspect of the IC (integrated circuit) product development process and describes how an emerging 'virtual test' methodology can be effectively, applied to reduce the overall product development time for semiconductor devices.

Details

ISSN :
09637346
Volume :
10
Database :
OpenAIRE
Journal :
Engineering Science & Education Journal
Accession number :
edsair.doi.dedup.....6c93628211e7d85ed24b797073a89791
Full Text :
https://doi.org/10.1049/esej:20010305