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MLCAD: A Survey of Research in Machine Learning for CAD Keynote Paper

Authors :
David Z. Pan
Yibo Lin
Jorg Henkel
Marilyn Wolf
Martin Rapp
Bei Yu
Hussam Amrouch
Source :
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 41 (10), 3162-3181
Publication Year :
2022
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2022.

Abstract

Due to the increasing size of s (s), their design and optimization phases (i.e., ) grow increasingly complex. At design time, a large design space needs to be explored to find an implementation that fulfills all specifications and then optimizes metrics like energy, area, delay, reliability, etc. At run time, a large configuration space needs to be searched to find the best set of parameters (e.g., voltage/frequency) to further optimize the system. Both spaces are infeasible for exhaustive search typically leading to heuristic optimization algorithms that find some trade-off between design quality and computational overhead. ML can build powerful models that have successfully been employed in related domains. In this survey, we categorize how () may be used and is used for design-time and run-time optimization and exploration strategies of s. A meta-study of published techniques unveils areas in that are well-explored and underexplored with, as well as trends in the employed algorithms. We present a comprehensive categorization and summary of the state of the art on for. Finally, we summarize remaining challenges and promising open research directions.

Details

Language :
English
ISSN :
02780070 and 19374151
Database :
OpenAIRE
Journal :
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 41 (10), 3162-3181
Accession number :
edsair.doi.dedup.....6d8623a49643e997f494666b4f6b1334
Full Text :
https://doi.org/10.5445/ir/1000140457