A noise detection scheme with 10 mK noise temperature resolution for semiconductor single electron tunneling devices

MLA

Patrice Jacques, et al. “A Noise Detection Scheme with 10 MK Noise Temperature Resolution for Semiconductor Single Electron Tunneling Devices.” Journal of Applied Physics, vol. 81, June 1997, pp. 7350–56. EBSCOhost, https://doi.org/10.1063/1.365332.

APA

Patrice Jacques, Laurent Saminadayar, A. Kumar, D. C. Glattli, & P. Pari. (1997). A noise detection scheme with 10 mK noise temperature resolution for semiconductor single electron tunneling devices. Journal of Applied Physics, 81, 7350–7356. https://doi.org/10.1063/1.365332

Chicago

Patrice Jacques, Laurent Saminadayar, A. Kumar, D. C. Glattli, and P. Pari. 1997. “A Noise Detection Scheme with 10 MK Noise Temperature Resolution for Semiconductor Single Electron Tunneling Devices.” Journal of Applied Physics 81 (June): 7350–56. doi:10.1063/1.365332.