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Characterisation of a PERCIVAL monolithic active pixel prototype using synchrotron radiation

Authors :
M. Zimmer
Seungyu Rah
I. Sedgwick
J. Marchal
M. Sussmuth
M. Niemann
M. Bayer
Cornelia B. Wunderer
U. Pedersen
M. Viti
D. Dipayan
I. Shevyakov
Giuseppe Cautero
Renato Turchetta
R. Fan
M. Tennert
K.S. Kim
G. Pinaroli
Heinz Graafsma
Dario Giuressi
Salim Reza
Hazem Yousef
P. Gottlicher
Q. Xia
S. Smoljanin
H.J. Hyun
Alessandro Marras
Paul Steadman
Nicola Guerrini
S. Lange
J. Correa
L. Stebel
Anastasiya Khromova
N. Rees
Nicola Tartoni
Ralph H Menk
B. Marsh
Source :
Journal of Instrumentation 11(02), C02090 (2016). doi:10.1088/1748-0221/11/02/C02090, iWoRiD 2015, Hamburg, Germany, 2015-06-28-2015-07-02
Publication Year :
2016
Publisher :
Deutsches Elektronen-Synchrotron, DESY, Hamburg, 2016.

Abstract

iWoRiD 2015, Hamburg, Germany, 28 Jun 2015 - 2 Jul 2015; Journal of Instrumentation 11(02), C02090 (2016). doi:10.1088/1748-0221/11/02/C02090<br />PERCIVAL ("Pixelated Energy Resolving CMOS Imager, Versatile And Large") is a monolithic active pixel sensor (MAPS) based on CMOS technology. Is being developed by DESY, RAL/STFC, Elettra, DLS, and PAL to address the various requirements of detectors at synchrotron radiation sources and Free Electron Lasers (FELs) in the soft X-ray regime. These requirements include high frame rates and FELs base-rate compatibility, large dynamic range, single-photon counting capability with low probability of false positives, high quantum efficiency (QE), and (multi-)megapixel arrangements with good spatial resolution. Small-scale back-side-illuminated (BSI) prototype systems are undergoing detailed testing with X-rays and optical photons, in preparation of submission of a larger sensor. A first BSI processed prototype was tested in 2014 and a preliminary result—first detection of 350eV photons with some pixel types of PERCIVAL—reported at this meeting a year ago. Subsequent more detailed analysis revealed a very low QE and pointed to contamination as a possible cause. In the past year, BSI-processed chips on two more wafers were tested and their response to soft X-ray evaluated. We report here the improved charge collection efficiency (CCE) of different PERCIVAL pixel types for 400eV soft X-rays together with Airy patterns, response to a flat field, and noise performance for such a newly BSI-processed prototype sensor.<br />Published by Inst. of Physics, London

Details

Language :
English
ISSN :
17480221
Database :
OpenAIRE
Journal :
Journal of Instrumentation 11(02), C02090 (2016). doi:10.1088/1748-0221/11/02/C02090, iWoRiD 2015, Hamburg, Germany, 2015-06-28-2015-07-02
Accession number :
edsair.doi.dedup.....76f2475f24e7c474cab3b71bf89ae7ab
Full Text :
https://doi.org/10.3204/pubdb-2016-05817