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Direct intensity calibration of X-ray grazing-incidence microscopes with home-lab source
- Source :
- The Review of scientific instruments. 89(1)
- Publication Year :
- 2018
-
Abstract
- Direct intensity calibration of X-ray grazing-incidence microscopes is urgently needed in quantitative studies of X-ray emission from laser plasma sources in inertial confinement fusion. The existing calibration methods for single reflecting mirrors, crystals, gratings, filters, and X-ray detectors are not applicable for such X-ray microscopes due to the specific optical structure and the restrictions of object-image relation. This article presents a reliable and efficient method that can be performed using a divergent X-ray source and an energy dispersive Si-PIN (silicon positive-intrinsic-negative) detector in an ordinary X-ray laboratory. The transmission theory of X-ray flux in imaging diagnostics is introduced, and the quantities to be measured are defined. The calibration method is verified by a W/Si multilayer-coated Kirkpatrick-Baez microscope with a field of view of ∼95 μm at 17.48 keV. The mirror reflectance curve in the 1D coordinate is drawn with a peak value of 20.9% and an uncertainty of ∼6.0%.
- Subjects :
- 010302 applied physics
Microscope
Materials science
business.industry
Astrophysics::High Energy Astrophysical Phenomena
Detector
Field of view
Plasma
Laser
01 natural sciences
law.invention
010309 optics
Optics
law
0103 physical sciences
Calibration
business
Instrumentation
Inertial confinement fusion
Intensity (heat transfer)
Subjects
Details
- ISSN :
- 10897623
- Volume :
- 89
- Issue :
- 1
- Database :
- OpenAIRE
- Journal :
- The Review of scientific instruments
- Accession number :
- edsair.doi.dedup.....7b4a6e93d3cd2fa765d146b02b01a44f