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UV LED reliability: degradation mechanisms and challenges

Authors :
Matteo Meneghini
Francesco Piva
Carlo De Santi
Nicola Trivellin
Matteo Buffolo
Nicola Roccato
Riccardo Brescancin
Massimo Grigoletto
Davide Fiorimonte
Sven Einfeldt
Johannes Glaab
Jan Ruschel
Norman Susilo
Tim Wernicke
Michael Kneissl
Gaudenzio Meneghesso
Enrico Zanoni
Source :
Gallium Nitride Materials and Devices XVII.
Publication Year :
2022
Publisher :
SPIE, 2022.

Subjects

Subjects :
reliability
UV LED
degradation

Details

Database :
OpenAIRE
Journal :
Gallium Nitride Materials and Devices XVII
Accession number :
edsair.doi.dedup.....7ba5e0087fb602783c773360e7045083
Full Text :
https://doi.org/10.1117/12.2606858
Full Text Access
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