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D+ : software for high-resolution hierarchical modeling of solution X-ray scattering from complex structures
- Source :
- Journal of applied crystallography 52(1), 219-242 (2019). doi:10.1107/S1600576718018046
- Publication Year :
- 2019
- Publisher :
- Wiley-Blackwell, 2019.
-
Abstract
- Journal of applied crystallography 52(1), 219 - 242 (2019). doi:10.1107/S1600576718018046<br />Published by Wiley-Blackwell, [S.l.]
- Subjects :
- Physics
0303 health sciences
Source code
Computer program
Scattering
business.industry
Computation
media_common.quotation_subject
02 engineering and technology
021001 nanoscience & nanotechnology
Grid
General Biochemistry, Genetics and Molecular Biology
Computer Programs
Scattering amplitude
03 medical and health sciences
Software
Scalability
ddc:540
0210 nano-technology
business
Algorithm
030304 developmental biology
media_common
Subjects
Details
- Language :
- English
- ISSN :
- 16005767
- Database :
- OpenAIRE
- Journal :
- Journal of applied crystallography 52(1), 219-242 (2019). doi:10.1107/S1600576718018046
- Accession number :
- edsair.doi.dedup.....7e2545062fa3ac45f9f46537b3b88786
- Full Text :
- https://doi.org/10.1107/S1600576718018046