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Systematic Analysis of Self-Assembled Nanodielectric Architecture and Organization Effects on Organic Transistor Switching

Authors :
Katie Stallings
Riccardo Turrisi
Yao Chen
Li Zeng
Binghao Wang
Jeremy Smith
Michael J. Bedzyk
Luca Beverina
Antonio Facchetti
Tobin J. Marks
Stallings, K
Turrisi, R
Chen, Y
Zeng, L
Wang, B
Smith, J
Bedzyk, M
Beverina, L
Facchetti, A
Marks, T
Source :
ACS Applied Electronic Materials. 4:2015-2025
Publication Year :
2022
Publisher :
American Chemical Society (ACS), 2022.

Abstract

The unconventional self-assembled nanodielectric (SAND) architecture is composed of solution-processed alternating inorganic (e.g., ZrOx and HfOx) and π-organic nanolayers (e.g., stilbazolium). As gate dielectrics, SANDs are compatible with a wide variety of organic and inorganic semiconductors and often impart superior thin-film transistor (TFT) performance in comparison to analogous inorganic-only dielectrics. The enhanced performance has been partly attributed to the interactions within the organic layers. To probe the role of the highly polarizable stilbazolium (Chr) organic layer in SAND structural organization and dielectric response, a saturated hydrocarbon chain-based self-assembling building block (Alk) was synthesized and incorporated in SAND structures. By using Chr and Alk in the different SAND organic layers, the effects of the Chr built-in dipole on bulk SAND structural and dielectric characteristics can be evaluated. The Zr-SAND structures are characterized by atomic force microscopy, X-ray reflectivity, metal-insulator-semiconductor electrical measurements, and pentacene-based organic TFTs. The layer identity and arrangement of the organic layers within the Zr-SAND structure are found to have a significant impact on the capacitor leakage current and pentacene transistor threshold voltage/turn-on voltage characteristics. Furthermore, significant cooperative interactions between adjacent Chr organic π-layers are important in enhancing these effects.

Details

ISSN :
26376113
Volume :
4
Database :
OpenAIRE
Journal :
ACS Applied Electronic Materials
Accession number :
edsair.doi.dedup.....7e2a9f981025e7c2b14201a4c7fdada7
Full Text :
https://doi.org/10.1021/acsaelm.2c00177