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Hard X-ray resonant electronic spectroscopy in transition metal oxides

Authors :
Jacques Jupille
Akio Kotani
P. Le Fèvre
D. Chandesris
Takayuki Uozumi
Antoine Barbier
Sylvie Bourgeois
Hélène Magnan
W. Drube
Surface du Verre et Interfaces (SVI)
Centre National de la Recherche Scientifique (CNRS)
Source :
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2005, 547 (1), pp.176. ⟨10.1016/j.nima.2005.05.023⟩
Publication Year :
2005
Publisher :
Elsevier BV, 2005.

Abstract

K-edge X-ray absorption and 2p-XPS spectra of 3d-element oxides present spectral features which cannot be explained within a simple one-electron model. These features reveal the fine electronic structure of transition metal (TM) oxides valence states resulting from hybridized TM-3d and O-2p states, and the correlations between these valence electrons. In this paper, we show how resonant electronic spectroscopy (resonant Auger or resonant photoelectron spectroscopy) around the TM K-edge can be used to interpret the structures of the threshold and, with the help of theoretical calculation, to determine the electronic configuration of the excited ion. Quadrupolar transitions towards localized 3d orbitals are hence detected and quantitatively characterized in the titanium K-edge prepeaks in TiO2 and in the Ni K-edge prepeaks in NiO by angular-dependent resonant KLL Auger measurements. Valuable information also seems to be available in the resonant behavior of 2p-XPS spectra of NiO and Fe2O3.

Details

ISSN :
01689002 and 18729576
Volume :
547
Database :
OpenAIRE
Journal :
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Accession number :
edsair.doi.dedup.....7ea1042ad2ee5bf6f3b5960e40065690
Full Text :
https://doi.org/10.1016/j.nima.2005.05.023