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Modeling of Radiation Damage Effects at HighLuminosity LHC Expected Fluences: Measurements and Simulations
- Source :
- 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017, 21-28 October 2017, info:cnr-pdr/source/autori:Morozzi A.; Moscatelli F.; Passeri D.; Bilei G.M.; Betta G.-F.D.; Bomben M.; Mattiazzo S./congresso_nome:2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS%2FMIC 2017/congresso_luogo:/congresso_data:21-28 October 2017/anno:2018/pagina_da:/pagina_a:/intervallo_pagine, 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, Oct 2017, Atlanta, United States. ⟨10.1109/NSSMIC.2017.8532824⟩
- Publication Year :
- 2018
- Publisher :
- Institute of Electrical and Electronics Engineers Inc., 2018.
-
Abstract
- International audience; A practical, yet physically grounded, TCAD modeling approach to study the radiation damage effects on silicon detectors exposed to the very high fluences expected at High Luminosity LHC (greater than 2.2×10 16 1MeV n eq /cm 2 ) is presented in this work. The modeling strategy is based on combined bulk and surface damage effects accounting for a limited number of measurable parameters. Starting from standard test structure measurements (i.e. MOS capacitors, gated diodes and MOSFETs), the most relevant parameters able to describe the complex phenomena related to the damage effects at these very high fluences have been extracted and therefore fed as input to the simulation tools. In particular the properties of the SiO 2 layer and of the SiO 2 /Si interface have been deeply investigated on high-resistivity n-type and p-type silicon test structures, before and after irradiation with X-rays in the range from 50 krad(SiO 2 ) to 20 Mrad(SiO 2 ). Thus the extrapolated dose-dependent parameters (e.g. interface trap density and oxide charge density) have been straight included in the TCAD modeling scheme. The adopted numerical approach has been validated by means of the comparison between simulation results and experimental data. To this purpose, steady-state and small signal analysis have been selected as reference analyses to assess the model suitability along with the charge collection efficiency. Different technology and design options/detector geometries can be therefore evaluated, from conventional planar pixelated (strip/pixel) detectors to active-edges or 3D (columnar electrodes) detectors, as well different principle of operation such as charge multiplication in Low Gain Avalanche Detector. This would support technology independence of the model and its use as a predictive tool for the design and the optimization of new classes of silicon sensors for the next generation High-Energy Physics experiments.
- Subjects :
- gated diodes
high-resistivity n-type
dimension: 3
X-ray: irradiation
High-luminosity LHC
charge multiplication
7. Clean energy
01 natural sciences
nuclear electronics
030218 nuclear medicine & medical imaging
law.invention
TCAD modeling approach
model suitability
Radiation damage
0302 clinical medicine
Planar
Low Gain Avalanche Detector
law
TCAD modeling scheme
radiation damage effects
radiation: damage
conventional planar pixelated detectors
standard test structure measurements
Detector
small signal analysis
Detectors
simulation tools
extrapolated dose-dependent parameters
Capacitor
CERN LHC Coll
SiO2-Si
radiation effects
Optoelectronics
semiconductor detector: microstrip
Surface damage effects
Extraterrestrial measurements
silicon: oxygen
modeling strategy
SiO2
Silicon
Materials science
simulation results
steady-state signal analysis
chemistry.chemical_element
SiO2/Si interface
3D detectors
Temperature measurement
programming
relevant parameters
high fluences
03 medical and health sciences
oxide charge density
MOSFET
semiconductor detector: pixel
0103 physical sciences
[PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det]
numerical calculations
p-type silicon test structures
Diode
trap density
MOS capacitors
semiconductor detector: technology
010308 nuclear & particles physics
business.industry
generation High-Energy Physics experiments
measurable parameters
Logic gates
position sensitive particle detectors
chemistry
High Luminosity LHC
silicon radiation detectors
electron volt energy 1 MeV
Silicon detectors
damage: surface
design option/detector geometries
strip/pixel detectors
business
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017, 21-28 October 2017, info:cnr-pdr/source/autori:Morozzi A.; Moscatelli F.; Passeri D.; Bilei G.M.; Betta G.-F.D.; Bomben M.; Mattiazzo S./congresso_nome:2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS%2FMIC 2017/congresso_luogo:/congresso_data:21-28 October 2017/anno:2018/pagina_da:/pagina_a:/intervallo_pagine, 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, Oct 2017, Atlanta, United States. ⟨10.1109/NSSMIC.2017.8532824⟩
- Accession number :
- edsair.doi.dedup.....7facb1770baea6bfae6d21d6bfa40ba5
- Full Text :
- https://doi.org/10.1109/NSSMIC.2017.8532824⟩