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Computer-forgetfulness, cosmic radiation, and an ion-microscope

Authors :
S. Metzger
J. Barak
E. Adler
B.E. Fischer
Publica
Publication Year :
1998

Abstract

After an introduction to the cosmic ray environment, we show why few-MeV heavy ions are suitable to simulate cosmic radiation effects in integrated circuits, and how the sensitive sites for various radiation effects can be localised using an ion microscope and a specially designed, small hardware circuit. As a tutorial for the potential of the microprobe technique we show a series of results obtained for a 2k × 8 bit static RAM (HM65162).

Details

Language :
English
Database :
OpenAIRE
Accession number :
edsair.doi.dedup.....8613563ed86558ac85e58570f5352677