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Normalized Cut Loss for Weakly-supervised CNN Segmentation
- Source :
- CVPR
- Publication Year :
- 2018
-
Abstract
- Most recent semantic segmentation methods train deep convolutional neural networks with fully annotated masks requiring pixel-accuracy for good quality training. Common weakly-supervised approaches generate full masks from partial input (e.g. scribbles or seeds) using standard interactive segmentation methods as preprocessing. But, errors in such masks result in poorer training since standard loss functions (e.g. cross-entropy) do not distinguish seeds from potentially mislabeled other pixels. Inspired by the general ideas in semi-supervised learning, we address these problems via a new principled loss function evaluating network output with criteria standard in "shallow" segmentation, e.g. normalized cut. Unlike prior work, the cross entropy part of our loss evaluates only seeds where labels are known while normalized cut softly evaluates consistency of all pixels. We focus on normalized cut loss where dense Gaussian kernel is efficiently implemented in linear time by fast Bilateral filtering. Our normalized cut loss approach to segmentation brings the quality of weakly-supervised training significantly closer to fully supervised methods.<br />Accepted at CVPR 2018
- Subjects :
- FOS: Computer and information sciences
Normalization (statistics)
Pixel
Computer science
business.industry
Computer Vision and Pattern Recognition (cs.CV)
Computer Science - Computer Vision and Pattern Recognition
Pattern recognition
02 engineering and technology
Image segmentation
010501 environmental sciences
01 natural sciences
Convolutional neural network
symbols.namesake
0202 electrical engineering, electronic engineering, information engineering
Gaussian function
symbols
020201 artificial intelligence & image processing
Segmentation
Artificial intelligence
Bilateral filter
business
0105 earth and related environmental sciences
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- CVPR
- Accession number :
- edsair.doi.dedup.....87ce5564955fdc9007f423a3e7c85dd0