Challenges and Opportunities with Highly Brilliant X-ray Sources for multi-Modal in-Situ and Operando Characterization of Solar Cells

Authors :: James J. Dynes
Rémi Tucoulou
Tara Nietzold
M. Holt
Andrew Ulvestad
Yong S. Chu
J. Wang
Evgeny Nazaretski
Michael Stuckelberger
Junjing Deng
Maik Kahnt
S. Hruszkewycz
Barry P. Lai
Volker Rose
J. Maser
Bradley West
Mariana I. Bertoni
Damien Salomon
Hanfei Yan
Z. Cai
Xiaojing Huang
Felix Wittwer
Trumann Walker
Christian G. Schroer
Christina Ossig
Source :: Microscopy and microanalysis 24(S2), 434-435 (2018). doi:10.1017/S1431927618014423, X-Ray Microscopy 2018, Saskatoon, Canada, 2018-08-19-2018-08-24
Publication Year :: 2018
Publisher :: Deutsches Elektronen-Synchrotron, DESY, Hamburg, 2018.
Abstract: X-Ray Microscopy 2018, Saskatoon, Canada, 19 Aug 2018 - 24 Aug 2018; Microscopy and microanalysis 24(S2), 434 - 435 (2018). doi:10.1017/S1431927618014423<br />Published by Cambridge University Press

Subjects :: In situ
Materials science
X-ray
Nanotechnology
02 engineering and technology
010402 general chemistry
021001 nanoscience & nanotechnology
01 natural sciences
0104 chemical sciences
Characterization (materials science)
Modal
ddc:570
0210 nano-technology
Instrumentation

Language :: English
ISSN :: 14319276
Database :: OpenAIRE
Journal :: Microscopy and microanalysis 24(S2), 434-435 (2018). doi:10.1017/S1431927618014423, X-Ray Microscopy 2018, Saskatoon, Canada, 2018-08-19-2018-08-24
Accession number :: edsair.doi.dedup.....88627adda5319e94434fde6de4c6cfca
Full Text :: https://doi.org/10.3204/pubdb-2018-02961

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