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Corrigendum: An advanced workflow for single-particle imaging with the limited data at an X-ray free-electron laser
- Source :
- IUCrJ 9(2), 328 (2022). doi:10.1107/S2052252522000501
- Publication Year :
- 2022
-
Abstract
- IUCrJ 9(2), 328 (2022). doi:10.1107/S2052252522000501<br />An error in Fig. 3(c) of the article by Assalauova et al. [IUCrJ (2020), 7, 1102–1113] is corrected.<br />Published by Chester
- Subjects :
- ddc:530
Subjects
Details
- Language :
- English
- ISSN :
- 20522525
- Database :
- OpenAIRE
- Journal :
- IUCrJ 9(2), 328 (2022). doi:10.1107/S2052252522000501
- Accession number :
- edsair.doi.dedup.....88a6cbb1e364ee6fc1c2e3bb75ec9911
- Full Text :
- https://doi.org/10.1107/S2052252522000501