Energy Loss Spectroscopy of RuO2 Thin Films

The dielectric constant and the reflectivity spectrum of polycrystalline RuO2 films, grown by pulsed laser deposition, are presented as deduced by optical reflection and electron energy-loss spectroscopy. The similarities of these spectra with those obtained on single crystals, suggest that the production of RuO2 by laser ablation is a very good tool in obtaining films with electronic and structural characteristics equivalent to those of the bulk material.