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Evaporation-induced self-assembling of few-layer graphene into a fractal-like conductive macro-network with a reduction of percolation threshold

Authors :
Izabela Janowska
Institut de chimie et procédés pour l'énergie, l'environnement et la santé (ICPEES)
Université de Strasbourg (UNISTRA)-Matériaux et nanosciences d'Alsace (FMNGE)
Institut de Chimie du CNRS (INC)-Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Institut National de la Santé et de la Recherche Médicale (INSERM)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Institut National de la Santé et de la Recherche Médicale (INSERM)-Centre National de la Recherche Scientifique (CNRS)-Centre National de la Recherche Scientifique (CNRS)
Source :
Physical Chemistry Chemical Physics, Physical Chemistry Chemical Physics, Royal Society of Chemistry, 2015, 17 (12), pp.7634-7638. ⟨10.1039/C5CP00460H⟩
Publication Year :
2015
Publisher :
Royal Society of Chemistry (RSC), 2015.

Abstract

The transcription of nanoproperties to other dimensions in an efficient and simple way by the appropriate design of devices is a challenge, and conductive nanocarbon systems are considered here. The evaporation-induced self-assembling method is proposed to form branched, fractal-like "2D" conductive macrostructures from (nano) micro few-layer graphene flakes. The self-assembled conductive graphene networks reveal a reduction of percolation threshold compared to a random arrangement (a lower matter concentration is required to make a given substrate conductive and at a lower coverage), and become a promising matrix for conductive (transparent) films. The method is easy, cost-efficient and can potentially be applied on unlimited surfaces.

Details

ISSN :
14639084 and 14639076
Volume :
17
Database :
OpenAIRE
Journal :
Physical Chemistry Chemical Physics
Accession number :
edsair.doi.dedup.....8c5c0055eb708e5811278d3d8a93f070