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Nonlinear ellipse rotation modified Z-scan measurements of third-order nonlinear susceptibility tensor

Authors :
Xiao-Qing Yan
Wei-Ping Zang
Zhi-Bo Liu
Jianguo Tian
Wen-Yuan Zhou
Source :
Optics Express. 15:13351
Publication Year :
2007
Publisher :
The Optical Society, 2007.

Abstract

We present a method that combines the Z-scan technique with nonlinear ellipse rotation (NER) to measure third-order nonlinear susceptibility components. The experimental details are demonstrated, and a comprehensive theoretical analysis is given. The validity of this method is verified by the measurements of the nonlinear susceptibility tensor of a well-characterized liquid, CS2.

Details

ISSN :
10944087
Volume :
15
Database :
OpenAIRE
Journal :
Optics Express
Accession number :
edsair.doi.dedup.....8ec2c0a84d3d25f66aee33af8ad7ca21
Full Text :
https://doi.org/10.1364/oe.15.013351