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Single-shot 3D shape measurement using an end-to-end stereo matching network for speckle projection profilometry
- Source :
- Optics Express. 29:13388
- Publication Year :
- 2021
- Publisher :
- Optica Publishing Group, 2021.
-
Abstract
- Speckle projection profilometry (SPP), which establishes the global correspondences between stereo images by projecting only a single speckle pattern, has the advantage of single-shot 3D reconstruction. Nevertheless, SPP suffers from the low matching accuracy of traditional stereo matching algorithms, which fundamentally limits its 3D measurement accuracy. In this work, we propose a single-shot 3D shape measurement method using an end-to-end stereo matching network for SPP. To build a high-quality SPP dataset for training the network, by combining phase-shifting profilometry (PSP) and temporal phase unwrapping techniques, high-precision absolute phase maps can be obtained to generate accurate and dense disparity maps with high completeness as the ground truth by phase matching. For the architecture of the network, a multi-scale residual subnetwork is first leveraged to synchronously extract compact feature tensors with 1/4 resolution from speckle images for constructing the 4D cost volume. Considering that the cost filtering based on 3D convolution is computationally costly, a lightweight 3D U-net network is proposed to implement efficient 4D cost aggregation. In addition, because the disparity maps in the SPP dataset should have valid values only in the foreground, a simple and fast saliency detection network is integrated to avoid predicting the invalid pixels in the occlusions and background regions, thereby implicitly enhancing the matching accuracy for valid pixels. Experiment results demonstrated that the proposed method improves the matching accuracy by about 50% significantly compared with traditional stereo matching methods. Consequently, our method achieves fast and absolute 3D shape measurement with an accuracy of about 100µm through a single speckle pattern.
- Subjects :
- Ground truth
Matching (statistics)
Pixel
business.industry
Computer science
Absolute phase
3D reconstruction
ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION
02 engineering and technology
021001 nanoscience & nanotechnology
01 natural sciences
Atomic and Molecular Physics, and Optics
010309 optics
Speckle pattern
Optics
Feature (computer vision)
0103 physical sciences
Computer vision
Artificial intelligence
0210 nano-technology
business
Projection (set theory)
Subjects
Details
- ISSN :
- 10944087
- Volume :
- 29
- Database :
- OpenAIRE
- Journal :
- Optics Express
- Accession number :
- edsair.doi.dedup.....93c0575f9365cb90c3c3b1057d630ef9