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Erratum: De Teresa, J.M. et al. Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions. Micromachines 2019, 10, 799
- Source :
- Micromachines, Vol 11, Iss 2, p 211 (2020)
- Publication Year :
- 2020
- Publisher :
- MDPI AG, 2020.
-
Abstract
- In Section 3 [...]
Details
- ISSN :
- 2072666X
- Volume :
- 11
- Database :
- OpenAIRE
- Journal :
- Micromachines
- Accession number :
- edsair.doi.dedup.....9447bd090ade26192ea4cc757778622d
- Full Text :
- https://doi.org/10.3390/mi11020211