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Self-Turn-on-Free 5V Gate Driving for 1200V Scaled IGBT

Authors :
Munetoshi Fukui
Masanori Tsukuda
Toshiro Hiramoto
Kiyoshi Takeuchi
Kazuo Itou
Takuya Saraya
Toshihiko Takakura
Shinichi Suzuki
Masaki Sudo
Tamotsu Ninomiya
Ichiro Omura
Seiya Abe
Kazunori Hasegawa
Source :
2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD).
Publication Year :
2019
Publisher :
IEEE, 2019.

Abstract

Negative biasing of the gate voltage in a scaled insulated gate bipolar transistor (IGBT) during the off-state was modeled and found to be effective against self-turn-on failures. The required self-turn-on-free criteria were verified experimentally.<br />31st IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD 2019), 19-23 May 2019, Shanghai, China

Details

Language :
English
ISSN :
19460201
Database :
OpenAIRE
Journal :
2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD)
Accession number :
edsair.doi.dedup.....96679af157a95d682b9a06f9a57da3d8