Back to Search
Start Over
An SRAM Based Monitor for Mixed-Field Radiation Environments
- Source :
- IEEE Transactions on Nuclear Science, IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (4), pp.1663-1670. ⟨10.1109/TNS.2014.2299733⟩
- Publication Year :
- 2014
- Publisher :
- HAL CCSD, 2014.
-
Abstract
- International audience; CERN hosts a large number of electronic devices and equipment, functioning over its different particle accelerators. In certain areas, they operate in harsh radiation environments. In order to assure their proper functionality, the equipment or some of their sensitive components undergo several tests in experimental test areas representative of the LHC radiation fields, while specialized monitors constantly record the respective radiation levels. The purpose of this study is to evaluate the use of monitors using recent technology nodes (90 nm) in order to have a better estimation of the expected error rate of the devices. The H4IRRAD experimental test area has been specifically designed to reproduce the radiation field that is present within the LHC tunnel and shielded areas. It has been used to test our custom SRAM based monitors. The monitors have been exposed to a maximum dose and high energy hadron fluence of about 76 Gy and 1.3 × 1011 cm-2 respectively. The results show that the total ionizing dose (TID) effect does not impact the bit cross section of our devices. Moreover the Single Event occurrence is coherent to the beam intensity fluctuations, proving that these devices are appropriate for SEU monitoring under mixed particle fields.
- Subjects :
- Nuclear and High Energy Physics
mixed particle fields
Radiation
01 natural sciences
law.invention
law
0103 physical sciences
Shielded cable
Electronic engineering
Electronics
Static random-access memory
Electrical and Electronic Engineering
Physics
[PHYS]Physics [physics]
Large Hadron Collider
010308 nuclear & particles physics
business.industry
Electrical engineering
Particle accelerator
SRAM
Particle accelerators
H4IRRAD
[SPI.TRON]Engineering Sciences [physics]/Electronics
Nuclear Energy and Engineering
Absorbed dose
business
Event (particle physics)
SEU
Subjects
Details
- Language :
- English
- ISSN :
- 00189499
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Nuclear Science, IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (4), pp.1663-1670. ⟨10.1109/TNS.2014.2299733⟩
- Accession number :
- edsair.doi.dedup.....9ccb9670a27dcfb9e759601d0b4dc41b
- Full Text :
- https://doi.org/10.1109/TNS.2014.2299733⟩