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An SRAM Based Monitor for Mixed-Field Radiation Environments

Authors :
Luigi Dilillo
Frédéric Wrobel
A. Todri
Julien Mekki
Alberto Bosio
Georgios Tsiligiannis
Arnaud Virazel
Patrick Girard
Frédéric Saigné
Markus Brugger
Serge Pravossoudovitch
TEST (TEST)
Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM)
Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)
Smart Integrated Electronic Systems (SmartIES)
European Organization for Nuclear Research (CERN)
Radiations et composants (RADIAC)
Institut d’Electronique et des Systèmes (IES)
Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)
Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)
CERN Genève
Source :
IEEE Transactions on Nuclear Science, IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (4), pp.1663-1670. ⟨10.1109/TNS.2014.2299733⟩
Publication Year :
2014
Publisher :
HAL CCSD, 2014.

Abstract

International audience; CERN hosts a large number of electronic devices and equipment, functioning over its different particle accelerators. In certain areas, they operate in harsh radiation environments. In order to assure their proper functionality, the equipment or some of their sensitive components undergo several tests in experimental test areas representative of the LHC radiation fields, while specialized monitors constantly record the respective radiation levels. The purpose of this study is to evaluate the use of monitors using recent technology nodes (90 nm) in order to have a better estimation of the expected error rate of the devices. The H4IRRAD experimental test area has been specifically designed to reproduce the radiation field that is present within the LHC tunnel and shielded areas. It has been used to test our custom SRAM based monitors. The monitors have been exposed to a maximum dose and high energy hadron fluence of about 76 Gy and 1.3 × 1011 cm-2 respectively. The results show that the total ionizing dose (TID) effect does not impact the bit cross section of our devices. Moreover the Single Event occurrence is coherent to the beam intensity fluctuations, proving that these devices are appropriate for SEU monitoring under mixed particle fields.

Details

Language :
English
ISSN :
00189499
Database :
OpenAIRE
Journal :
IEEE Transactions on Nuclear Science, IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (4), pp.1663-1670. ⟨10.1109/TNS.2014.2299733⟩
Accession number :
edsair.doi.dedup.....9ccb9670a27dcfb9e759601d0b4dc41b
Full Text :
https://doi.org/10.1109/TNS.2014.2299733⟩