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Packaging and metallisation effects of valley microstrip line with slit for use in very small multilayer MMICs
- Source :
- 1994 IEEE MTT-S International Microwave Symposium Digest (Cat. No.94CH3389-4).
- Publication Year :
- 2002
- Publisher :
- IEEE, 2002.
-
Abstract
- The authors analyse the packaging and metallisation effects of a valley microstrip line with a slit applied to practical circuits. The analysis is based on the finite difference method in conjunction with the higher order asymptotic boundary condition. The results presented here have the following interesting features: The higher order asymptotic boundary condition can put the outer boundary much closer to the centre of a valley microstrip line. As a result, much less computational effort needs to be made for accurate performance prediction; when a shielding metal box, if any, is 2-3 times the thickness of the dielectric film, the packaging effect is appreciable; for a dielectric film of micrometre order, the metallisation thickness of the valley strip and the slit ground metal have significant influence on the characteristic parameters; and the characteristic impedance and the effective dielectric constant can be adjusted by changing the oblique angle and the slit width.
- Subjects :
- Permittivity
Engineering
business.industry
Circuit design
Electrical engineering
Dielectric
Oblique angle
Slit
Characteristic impedance
Microstrip
Optics
Electromagnetic shielding
Optoelectronics
Boundary value problem
Slit width
Electrical and Electronic Engineering
business
Stripline
Monolithic microwave integrated circuit
Slotted waveguide
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- 1994 IEEE MTT-S International Microwave Symposium Digest (Cat. No.94CH3389-4)
- Accession number :
- edsair.doi.dedup.....9dbcc4d4f09deca7d5bce056c84ccf27