Direct measurement of spurious mode properties in thin film BAW resonator

MLA

Kimmo Kokkonen, et al. Direct Measurement of Spurious Mode Properties in Thin Film BAW Resonator. Jan. 2010. EBSCOhost, https://doi.org/10.1109/ULTSYM.2010.5935750.

APA

Kimmo Kokkonen, Johanna Meltaus, Tuomas Pensala, & Matti Kaivola. (2010). Direct measurement of spurious mode properties in thin film BAW resonator. https://doi.org/10.1109/ULTSYM.2010.5935750

Chicago

Kimmo Kokkonen, Johanna Meltaus, Tuomas Pensala, and Matti Kaivola. 2010. “Direct Measurement of Spurious Mode Properties in Thin Film BAW Resonator,” January. doi:10.1109/ULTSYM.2010.5935750.