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DIABLO: Dictionary-based attention block for deep metric learning
- Source :
- Pattern Recognition Letters, Pattern Recognition Letters, Elsevier, 2020, ⟨10.1016/j.patrec.2020.03.020⟩
- Publication Year :
- 2020
- Publisher :
- HAL CCSD, 2020.
-
Abstract
- Recent breakthroughs in representation learning of unseen classes and examples have been made in deep metric learning by training at the same time the image representations and a corresponding metric with deep networks. Recent contributions mostly address the training part (loss functions, sampling strategies, etc.), while a few works focus on improving the discriminative power of the image representation. In this paper, we propose DIABLO, a dictionary-based attention method for image embedding. DIABLO produces richer representations by aggregating only visually-related features together while being easier to train than other attention-based methods in deep metric learning. This is experimentally confirmed on four deep metric learning datasets (Cub-200-2011, Cars-196, Stanford Online Products, and In-Shop Clothes Retrieval) for which DIABLO shows state-of-the-art performances.<br />Pre-print. Accepted for publication at Pattern Recognition Letters
- Subjects :
- FOS: Computer and information sciences
Computer science
Computer Vision and Pattern Recognition (cs.CV)
Computer Science - Computer Vision and Pattern Recognition
02 engineering and technology
computer.software_genre
01 natural sciences
Image (mathematics)
Discriminative model
[STAT.ML]Statistics [stat]/Machine Learning [stat.ML]
Artificial Intelligence
0103 physical sciences
0202 electrical engineering, electronic engineering, information engineering
010306 general physics
ComputingMilieux_MISCELLANEOUS
Block (data storage)
business.industry
Sampling (statistics)
[INFO.INFO-CV]Computer Science [cs]/Computer Vision and Pattern Recognition [cs.CV]
Signal Processing
Metric (mathematics)
Embedding
020201 artificial intelligence & image processing
Computer Vision and Pattern Recognition
Artificial intelligence
Focus (optics)
business
Feature learning
computer
Software
Natural language processing
Subjects
Details
- Language :
- English
- ISSN :
- 01678655
- Database :
- OpenAIRE
- Journal :
- Pattern Recognition Letters, Pattern Recognition Letters, Elsevier, 2020, ⟨10.1016/j.patrec.2020.03.020⟩
- Accession number :
- edsair.doi.dedup.....a521befeb6d9d52d7b745382b9cb84f2
- Full Text :
- https://doi.org/10.1016/j.patrec.2020.03.020⟩