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Optical measurement of partial discharges under impulse voltage on ceramic substrates embedded in silicone oil

Authors :
Olivier Lesaint
A. T. Vu Thi
J.-L. Auge
Ampère (AMPERE)
École Centrale de Lyon (ECL)
Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL)
Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon)
Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE)
Laboratoire de Génie Electrique de Grenoble (G2ELab)
Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut Polytechnique de Grenoble - Grenoble Institute of Technology-Centre National de la Recherche Scientifique (CNRS)
Source :
Proceedings of the 2013 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, 2013 IEEE CEIDP, 2013 IEEE CEIDP, Oct 2013, Shenzhen, China. pp.1294, ⟨10.1109/CEIDP.2013.6748330⟩
Publication Year :
2013
Publisher :
HAL CCSD, 2013.

Abstract

This paper presents an experimental study of Partial Discharges and light emission with ceramic substrates embedded in silicone oil, under ac and square high voltage. Two types of ceramic materials used in power electronics modules are considered: Aluminum Nitrite (AlN) and Alumina (Al2O3). With AlN, a large light emission due to the electroluminescence of the ceramics occurs during the negative dV/dt. This phenomenon is not observed with Al2O3. With Al2O3 and silicon oil, the light emitted is only due to PDs, and recording under square voltage wave shows that PDs are more numerous and/or more intense compared to ac. Square voltage is more relevant to actual working conditions within power electronics modules than ac.

Details

Language :
English
Database :
OpenAIRE
Journal :
Proceedings of the 2013 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, 2013 IEEE CEIDP, 2013 IEEE CEIDP, Oct 2013, Shenzhen, China. pp.1294, ⟨10.1109/CEIDP.2013.6748330⟩
Accession number :
edsair.doi.dedup.....a69d66e495c87e5d0b6ec04dbd268c36
Full Text :
https://doi.org/10.1109/CEIDP.2013.6748330⟩