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Electron Beam Infrared Nano-Ellipsometry of Individual Indium Tin Oxide Nanocrystals
- Source :
- Nano letters. 20(11)
- Publication Year :
- 2020
-
Abstract
- Leveraging recent advances in electron energy monochromation and aberration correction, we record the spatially resolved infrared plasmon spectrum of individual tin-doped indium oxide nanocrystals using electron energy-loss spectroscopy (EELS). Both surface and bulk plasmon responses are measured as a function of tin doping concentration from 1-10 atomic percent. These results are compared to theoretical models, which elucidate the spectral detuning of the same surface plasmon resonance feature when measured from aloof and penetrating probe geometries. We additionally demonstrate a unique approach to retrieving the fundamental dielectric parameters of individual semiconductor nanocrystals via EELS. This method, devoid from ensemble averaging, illustrates the potential for electron-beam ellipsometry measurements on materials that cannot be prepared in bulk form or as thin films.
- Subjects :
- Materials science
business.industry
Mechanical Engineering
Electron energy loss spectroscopy
Physics::Optics
chemistry.chemical_element
Bioengineering
General Chemistry
Condensed Matter Physics
Indium tin oxide
Condensed Matter::Materials Science
chemistry
Ellipsometry
Physics::Atomic and Molecular Clusters
Optoelectronics
General Materials Science
Thin film
Surface plasmon resonance
Spectroscopy
business
Indium
Plasmon
Subjects
Details
- ISSN :
- 15306992
- Volume :
- 20
- Issue :
- 11
- Database :
- OpenAIRE
- Journal :
- Nano letters
- Accession number :
- edsair.doi.dedup.....a763a761755ef27cbd1575fc8de9835d