On the correlation between SILC and hole fluence throughout the oxide

MLA

Gabriella Ghidini, et al. “On the Correlation between SILC and Hole Fluence throughout the Oxide.” Microelectronics Reliability, vol. 39, Feb. 1999, pp. 197–201. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi.dedup.....a7e7ce402a8cc9f8458580933bd36dbb&authtype=sso&custid=ns315887.

APA

Gabriella Ghidini, Gerard Ghibaudo, Alessandro Paccagnella, G. Pananakakis, A. Scarpa, & B. De Salvo. (1999). On the correlation between SILC and hole fluence throughout the oxide. Microelectronics Reliability, 39, 197–201.

Chicago

Gabriella Ghidini, Gerard Ghibaudo, Alessandro Paccagnella, G. Pananakakis, A. Scarpa, and B. De Salvo. 1999. “On the Correlation between SILC and Hole Fluence throughout the Oxide.” Microelectronics Reliability 39 (February): 197–201. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi.dedup.....a7e7ce402a8cc9f8458580933bd36dbb&authtype=sso&custid=ns315887.